PHI TRIFT V - nanoTOF - Time-Of-Flight Secondary Ion Mass Spectrometry

Brief description

A high-sensitivity platform with sub-micron spatial resolution for characterising the surface chemistry of samples from the environmental, physical and life sciences. ToF-SIMS is an analytical technique used to image and record organic and inorganic mass spectral data of solid materials. It is a highly sensitive technique that provides chemical information regarding elemental, isotopic and molecular structure from the top 1-2 nanometres of a surface.