Data

New approach to controllable nitrogen doping for improved nano-semiconductors

Deakin University
Dai, Xiujuan (Jane) ; Chen, Ying (Ian)
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ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adc&rfr_id=info%3Asid%2FANDS&rft_id=info:doi10.26187/deakin.25807825.v1&rft.title=New approach to controllable nitrogen doping for improved nano-semiconductors&rft.identifier=10.26187/deakin.25807825.v1&rft.publisher=Deakin University&rft.description=The data covers the following:X-ray photoelectron spectroscopy (XPS) - to collect surface chemical structure changes (using RMIT instrument);Scanning electron microscopy (SEM) - to collect surface physical structure changes;Atomic force microscopy (AFM) - to collect surface morphology changes;Internal/External quantum efficiency (IQE/EQE) – to collect DSSC (Dye Sensitised Solar Cells) efficiency data;Discharge/Charge capacity - to collect battery efficiency data.&rft.creator=Dai, Xiujuan (Jane) &rft.creator=Chen, Ying (Ian) &rft.date=2024&rft.edition=1&rft_rights= https://creativecommons.org/licenses/by/4.0/&rft_subject=Photonic and electro-optical devices, sensors and systems (excl. communications)&rft_subject=Nanomaterials&rft_subject=plasma&rft_subject=nitrogen-doping&rft_subject=nano-semiconductors&rft.type=dataset&rft.language=English Access the data
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The data covers the following:
X-ray photoelectron spectroscopy (XPS) - to collect surface chemical structure changes (using RMIT instrument);
Scanning electron microscopy (SEM) - to collect surface physical structure changes;
Atomic force microscopy (AFM) - to collect surface morphology changes;
Internal/External quantum efficiency (IQE/EQE) – to collect DSSC (Dye Sensitised Solar Cells) efficiency data;
Discharge/Charge capacity - to collect battery efficiency data.

Issued: 17 05 2024

Created: 17 05 2024

Modified: 22 05 2024

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Subjects
Nanomaterials | Photonic and electro-optical devices, sensors and systems (excl. communications) | nano-semiconductors | nitrogen-doping | plasma |

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