Microscopy data of van der Waals heterostructures via WO3-x thin film sulfurization

ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adc&rfr_id=info%3Asid%2FANDS&rft_id=info:doi10.25912/RDF_1619058911429&rft.title=Microscopy data of van der Waals heterostructures via WO3-x thin film sulfurization&rft.identifier=10.25912/RDF_1619058911429&rft.publisher=Queensland University of Technology&rft.description=This dataset contains scanning tunnelling microscopy (STM), X-ray Photoemission Spectroscopy (XPS) and Raman spectroscopy data of WS2/graphene/SiC van der Waals heterostructures grown by sulfurisation of WO3 thin films. The dataset is also available in the following paper: Bradford, Jonathan, Shafiei, Mahnaz, MacLeod, Jennifer, & Motta, Nunzio (2020) Synthesis and characterization of WS2/graphene/SiC van der Waals heterostructures via WO3−x thin film sulfurization. Scientific Reports, 10, Article number: 17334. &rft.creator=Bradford, Jonathan &rft.creator=Shafei, Mahnaz &rft.creator=MacLeod, Jennifer &rft.creator=Motta, Nunzio &rft.date=2020&rft.edition=1&rft.relation=10.1038/s41598-020-74024-w &rft.coverage=Data collected at the Central Analytical Research Facility (CARF), QUT &rft_rights=© Queensland University of Technology, 2020.&rft_rights=Creative Commons Attribution 3.0 http://creativecommons.org/licenses/by/4.0/&rft_subject=CONDENSED MATTER PHYSICS&rft_subject=PHYSICAL SCIENCES&rft_subject=MATERIALS ENGINEERING&rft_subject=ENGINEERING&rft_subject=Surfaces and Structural Properties of Condensed Matter&rft_subject=NANOTECHNOLOGY&rft_subject=TECHNOLOGY&rft.type=dataset&rft.language=English Access the data