Hitachi SU3900 scanning electron microscope

Full description

General descriptionThe Hitachi SU3900 scanning electron microscope has a large chamber size and a variable pressure capability. This allows the study of non-conductive samples (natural minerals, man-made ceramics, soil, dust) without coating. The microscope is equipped with a Bruker energy dispersive spectroscopy (EDS) detector, Esprit EDS analysis software, and AMICS automated mineralogy software. It is ideal for large area secondary electron (SE) or back scattered electron (BSE) imaging, elemental and phase mapping. Chemical analysis resolution is 1 micron.Hardware specificationsResolution (SE):- 3.0 nm at 30 kV (High vacuum mode)- 15.0 nm at 1 kV (High vacuum mode)Resolution (BSE):- 4.0 nm at 30 kV (Variable pressure mode)Magnification:- 5× – 300,000× (on photo)- 7x – 800,000x (on display)- Accelerating Voltage: 0.3 to 30 kVDetectors:- Everhart Thornley SE Detector,- high sensitivity semiconductor BSE detector,- Ultra-variable pressure detector (UVD),- Bruker XFlash 6/60 EDS detector5-axis Motorised Specimen Stage:- Computer controlled motorisation (XYRTZ);- X: 0 - 150 mm,- Y: 0 – 150 mm,- Z: 5 - 85 mm,- Rotation 360°,- Tilt −20° to +90°.Specimen dimensions:- 300 mm,- 130 mm height.Software specificationsHitachi 3900 V1.12; Bruker Esprit V2.5Supporting equipmentFully automated TMP based vacuum systemAccess rightsAccess is available for trained operators through hourly rate, fee-for-service for UQ internal or external clients, or special arrangement.