Data

Examination of Ion Irradiation of Ternary Pyrochlore Oxides

Australian Nuclear Science and Technology Organisation

Viewed: [[ro.stat.viewed]] Cited: [[ro.stat.cited]] Accessed: [[ro.stat.accessed]]

ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adc&rfr_id=info%3Asid%2FANDS&rft_id=http://research-data.ansto.gov.au/collection/726&rft.title=Examination of Ion Irradiation of Ternary Pyrochlore Oxides&rft.identifier=research-data.ansto.gov.au/collection/726&rft.publisher=Australian Nuclear Science and Technology Organisation&rft.description=Ion irradiation damage was measured on polycrystalline synthetic samples of Y2Ti2-xSnxO7 (x = 0.4, 0.8, 1.2 and 1.6), in situ with Nd2Zr2O7, Nd2Zr1.2Ti0.8O7, and La1.6Y0.4Hf2O7 using a voltage electron microscope (IVEM) at Argonne National Laboratory (ANL). Measurements were taken at 1.0 MeV Kr ions at temperatures of 50 to 650 K.&rft.creator=Anonymous&rft.date=2011&rft_subject=Materials Engineering not elsewhere classified&rft_subject=ENGINEERING&rft_subject=MATERIALS ENGINEERING&rft_subject=Pyrochlore Oxides&rft_subject=Polycrystalline&rft_subject=Voltage Electron Microscope&rft_subject=Irradiation&rft.type=dataset&rft.language=English Access the data

Cite Saved to MyRDA Save to MyRDA

Access:

Other view details

This collection has restricted access to the datasets. Contact the associated parties for this record to negotiate access conditions, terms and attribution.

Brief description

Ion irradiation damage was measured on polycrystalline synthetic samples of Y2Ti2-xSnxO7 (x = 0.4, 0.8, 1.2 and 1.6), in situ with Nd2Zr2O7, Nd2Zr1.2Ti0.8O7, and La1.6Y0.4Hf2O7 using a voltage electron microscope (IVEM) at Argonne National Laboratory (ANL). Measurements were taken at 1.0 MeV Kr ions at temperatures of 50 to 650 K.

Subjects

User Contributed Tags

Other Information

uri : http://dx.doi.org/10.2138/am.2010.3329 External Link

Identifiers

Local : research-data.ansto.gov.au/collection/726