Data

Data for "Thermal Processes and their Impact on Surface Related Degradation"

University of New South Wales
Hamer, Phillip ; Chen, Daniel ; Bonilla, Ruy S.
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ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adc&rfr_id=info%3Asid%2FANDS&rft_id=info:doi10.26190/p2xp-6x55&rft.title=Data for Thermal Processes and their Impact on Surface Related Degradation&rft.identifier=https://doi.org/10.26190/p2xp-6x55&rft.publisher=UNSW, Sydney&rft.description=Photoconductance carrier lifetime measurements for the paper Thermal Processes and their Impact on Surface Related Degradation published in physica status solidi - rapid research letters&rft.creator=Hamer, Phillip &rft.creator=Chen, Daniel &rft.creator=Bonilla, Ruy S. &rft.date=2021&rft.relation=http://hdl.handle.net/1959.4/100197&rft_rights= https://creativecommons.org/licenses/by/4.0/&rft_subject=Silicon&rft_subject=Photovoltaics&rft_subject=Degradation&rft_subject=Surface Passivation&rft_subject=Defect Engineering&rft_subject=Photodetectors, Optical Sensors and Solar Cells&rft_subject=ENGINEERING&rft_subject=ELECTRICAL AND ELECTRONIC ENGINEERING&rft.type=dataset&rft.language=English Access the data
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Photoconductance carrier lifetime measurements for the paper "Thermal Processes and their Impact on Surface Related Degradation" published in physica status solidi - rapid research letters

Issued: 2021

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Subjects
Defect Engineering | Degradation | Electrical and Electronic Engineering | Engineering | Photodetectors, Optical Sensors and Solar Cells | Photovoltaics | Silicon | Surface Passivation |

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Identifiers
ACN 633 798 857